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Bradley William Scheer
Attorney
San Jose, California
phone(408) 278-4040
fax(408) 849-4537
emailbscheer@slwip.com
vcardslw-bscheer-slwip-com-1250548419.vcf

Bradley Scheer is a registered patent attorney with experience in technical litigation support and preparing and prosecuting patent applications in a range of technologies, including semiconductor device physics, semiconductor processing, semiconductor equipment, integrated circuits, videoconferencing, and medical devices. Brad has over 15 years of research and development, engineering, and management experience prior to becoming a patent practitioner. He has ten issued patents in the semiconductor field, has contributed papers to more than 30 semiconductor industry publications and peer-reviewed journals and was a featured speaker at various domestic and international technology venues. Additionally, he served two consecutive terms as Chairman of the Industrial Advisory Board for the graduate school of engineering at Arizona State University and has served in various leadership positions with SEMI, SEMATECH, and ASTM.

Areas of Practice:

  • Analog circuits
  • Computer Hardware & Design
  • Control systems
  • Digital circuits
  • Electrical
(click for more)
  • Electronics, including RF electronics
  • Image & Signal Processing
  • Integrated Circuit Design
  • Magnetic/Optical Recording Media
  • Material Science
  • Medical Devices
  • Medical Sensors and Monitors
  • Mixed-signal IC design and fabrication
  • Nanotechnology
  • Optical/Laser
  • Opto-electronics
  • Semiconductor Processing Equipment
  • Videoconferencing

Bar Admissions:

  • California
  • U.S. Patent and Trademark Office

Patent Services:

  • Patent Prosecution

Education:

  • Lincoln University School of Law, San Jose, CA
    • J.D.
    • With Honors
    • Dean Joseph V. Thibodeaux Scholarship for Highest GPA
    • Pat Tillman Scholarship
    • Outstanding Graduate
    • Wm. A. Ingram Inns of Court
    • Law Review: Editor-in-Chief; Judicial Extern/Clerk - The Honorable James Ware; U.S. Dist. Court, N.D. CA
  • University of Minnesota, Minneapolis, MN
    • M.S.
    • Thesis: Semiconductor Surface and Sub-Surface Device Characterization
    • Major: Engineering
  • University of Minnesota, Minneapolis, MN
    • B.S.
    • Pi Tau Sigma Engineering Society
    • Golden Key National Honor Society
    • INPO National Engineering Scholarship Recipient
    • Major: Engineering (Emphasis in particle physics/material science) Minor: Mathematics
  • Concordia College, Moorhead, MN
    • B.A.
    • Major: Philosophy

• California State Bar Association

• Silicon Valley Intellectual Property Association (SVIPLA)

• San Francisco Bay Area Intellectual Property Inn of Court

• "Indemnification for Patent Infringement under the Uniform Commercial Code", 34 Lincoln L. Rev. 1, 2006 - 2007

• "Extensibility of the Attorney-Client Privilege to Registered Patent Agents", 33 Lincoln L. Rev. 75, 2005 - 2006

• "Germer, T.A. and B.W. Scheer, Polarization of Out-of-Plane Scattering from Si02 Films Grown on Photolithographically-Generated Microrough Silicon", SPIE '98

• "Germer, Thomas A., Clara C. Asmail, and Bradley W. Scheer, Polarization of Out-of-Plane Scattering from Microrough Silicon", Optics Letters, 1284, vol. 22, no. 17, September 1, 1997

• "Scheer, Bradley W. and John C. Stover, Development of a Smooth-Surface Microroughness Standard", SPIE '97 Symposium, Scattering and Surface Roughness, Proceedings 3141, pgs 78-87, San Diego, July 28 - August 1, 1997

• "Mulholland, George W., B.W. Scheer, and R.K. Goodall, Challenges with Characterization and Detection of Reference Particles on Various Substrates", Society of Photo-optical and Instrumental Engineers, SPIE '96 Symposium: Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays, Denver, Co., vol. 2862, pgs 104-118, August 5-9, 1996

• "Hirleman, E.D., E.J. Bawolek, and B.W. Scheer, Light Scattering by Cylindrical Etch Pit Artifacts: Kirchoff Diffraction Theory and Experiments", International Workshop on Semiconductor Characterization: Present Status and Future Needs, NIST, Gaithersburg, MD, January 30 - February 2, 1995

• Registered Patent Agent/Attorney, Schneck & Schneck, 2003 - 2008

• Registered Patent Agent, Carr & Ferrell, LLP, 2000 - 2003

• Director of R&D, KLA-Tencor, 1989 - 2000

• Recipient of 10 Issued U.S. Patents in Field of Semiconductor Characterization

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