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The Right Way to Calculate Due Dates in Europe and China
If you are docketing in China or Europe, you may notice that calculated due dates don’t match the dates given by your foreign associate. This program will explain why and the proper way to calculate due dates in these countries.
Using Analytics as a Patent Annuity Decision Tool
Join us as our panel discusses best practices for the annuity payment decision process and how patent analytics can help assist annuity decision makers in making the best decisions possible.
IP Punch List for Software Companies
The Software field is a dynamic growing area. This webinar will focus on the challenges that software companies face in protecting their innovations both in the US and in other important jurisdictions.
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Schwegman is teaming up with WIPO to host an all-day complimentary "Advanced PCT Training" seminar that will provide insights to practitioners on amendments and recent developments to the PCT rules, developing a strategy for international filings and procedural safeguards.
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Schwegman Lundberg & Woessner

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Brad Sheer
Areas of Practice
  • Electrical & Computers
  • Mechanical & Electromechanical
  • Medical Devices
  • Software & E-Commerce
IP Services
  • Foreign Rights
  • Freedom To Operate
  • Patent Prosecution
  • Portfolio Management & Analysis
Overview
Education
Bar Admissions & Associations
Published Works
Past Experience
Overview
Overview

Bradley W. Scheer is a registered patent attorney with experience in technical litigation support and preparing and prosecuting patent applications in a range of technologies, including semiconductor device physics, semiconductor processing, semiconductor equipment, integrated circuits, videoconferencing, and medical devices. Brad has over 15 years of research and development, engineering, and management experience prior to becoming a patent practitioner. He has ten issued patents in the semiconductor field, has contributed papers to more than 30 semiconductor industry publications and peer-reviewed journals and was a featured speaker at various domestic and international technology venues. Additionally, Brad served two consecutive terms as Chairman of the Industrial Advisory Board for the graduate school of engineering at Arizona State University and has served in various leadership positions with SEMI, SEMATECH, and ASTM.

Brad is also an adjunct professor in the School of Engineering at the University of California – Merced, where he teaches intellectual property law for engineers and scientists.  He also serves as a member of the school’s Engineering Advisory Board, is a member of both the Dean’s Advisory Board and the IP Advisory Board for Lincoln School of Law, and serves on the 19-member editorial board of the American Intellectual Property Law Association (AIPLA) Quarterly Journal.

 

Education
Education
Lincoln University School of Law
San Jose, CA, J.D. with Honors
Dean Joseph V. Thibodeaux Scholarship for Highest GPA
Pat Tillman Scholarship
Outstanding Graduate
Wm. A. Ingram Inns of Court

Law Review: Editor-in-Chief

University of Minnesota
Minneapolis, MN, M.S.
Thesis: Semiconductor Surface and Sub-Surface Device Characterization

Major: Engineering

University of Minnesota
Minneapolis, MN, B.S.
Pi Tau Sigma Engineering Society
Golden Key National Honor Society
INPO National Engineering Scholarship Recipient

Major: Engineering (Emphasis in particle physics/material science) Minor: Mathematics

Concordia College
Moorhead, MN, B.A.
Major: Philosophy
Bar Admissions & Associations
Bar Admissions & Associations
Bar Admissions
California

U.S. Patent and Trademark Office

Associations
California State Bar Association
Silicon Valley Intellectual Property Association (SVIPLA)
San Francisco Bay Area Intellectual Property Inn of Court
Published Works
Published Works

Scheer, Bradley W., “Indemnification for Patent Infringement under the Uniform Commercial Code,” 34 Lincoln L. Rev. 1, 2006 – 2007.

Scheer, Bradley W., “Extensibility of the Attorney-Client Privilege to Registered Patent Agents,” 33 Lincoln L. Rev. 75, 2005 – 2006.

Germer, T.A. and Scheer, Bradley W., “Polarization of Out-of-Plane Scattering from Si02 Films Grown on Photolithographically-Generated Microrough Silicon,” SPIE ’98.

Germer, Thomas A., Asmail, Clara C., and Scheer, Bradley W., “Polarization of Out-of-Plane Scattering from Microrough Silicon,” Optics Letters, 1284, vol. 22, no. 17, September 1, 1997.

Scheer, Bradley W. and Stover, John C., “Development of a Smooth-Surface Microroughness Standard,” SPIE ’97 Symposium, Scattering and Surface Roughness, Proceedings 3141, pgs 78-87, San Diego, July 28 – August 1, 1997.

Mulholland, George W., Scheer, Bradley W., and Goodall, R.K, “Challenges with Characterization and Detection of Reference Particles on Various Substrates,” Society of Photo-optical and Instrumental Engineers, SPIE ’96 Symposium: Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays, Denver, Co., vol. 2862, pgs 104-118, August 5-9, 1996.

Hirleman, E.D., Bawolek, E.J., and Scheer, Bradley W, “Light Scattering by Cylindrical Etch Pit Artifacts: Kirchoff Diffraction Theory and Experiments,” International Workshop on Semiconductor Characterization: Present Status and Future Needs, NIST, Gaithersburg, MD, January 30 – February 2, 1995

Past Experience
Past Experience

Registered Patent Agent/Attorney, Schneck & Schneck, 2003 – 2008

Registered Patent Agent, Carr & Ferrell, LLP, 2000 – 2003

Director of R&D, KLA-Tencor, 1989 – 2000

Senior R&D Engineer, Atcor, Inc., Instrumentation Division, 1988-1989