Brad Scheer is a registered patent attorney with experience in technical litigation support and preparing and prosecuting patent applications in a range of technologies, including semiconductor device physics, semiconductor processing, semiconductor equipment, integrated circuits, videoconferencing, and medical devices. Brad has over 15 years of research and development, engineering, and management experience prior to becoming a patent practitioner. He has ten issued patents in the semiconductor field, has contributed papers to more than 30 semiconductor industry publications and peer-reviewed journals and was a featured speaker at various domestic and international technology venues. Additionally, Brad served two consecutive terms as Chairman of the Industrial Advisory Board for the graduate school of engineering at Arizona State University and has served in various leadership positions with SEMI, SEMATECH, and ASTM.
Brad is also an adjunct professor in the School of Engineering at the University of California – Merced, where he teaches intellectual property law for engineers and scientists. He also serves as a member of the school’s Engineering Advisory Board, is a member of both the Dean’s Advisory Board and the IP Advisory Board for Lincoln School of Law, and serves on the 19-member editorial board of the American Intellectual Property Law Association (AIPLA) Quarterly Journal.
Law Review: Editor-in-Chief
Major: Engineering (Emphasis in particle physics/material science) Minor: Mathematics
U.S. Patent and Trademark Office
Scheer, Bradley W., “Indemnification for Patent Infringement under the Uniform Commercial Code,” 34 Lincoln L. Rev. 1, 2006 – 2007.
Scheer, Bradley W., “Extensibility of the Attorney-Client Privilege to Registered Patent Agents,” 33 Lincoln L. Rev. 75, 2005 – 2006.
Germer, T.A. and Scheer, Bradley W., “Polarization of Out-of-Plane Scattering from Si02 Films Grown on Photolithographically-Generated Microrough Silicon,” SPIE ’98.
Germer, Thomas A., Asmail, Clara C., and Scheer, Bradley W., “Polarization of Out-of-Plane Scattering from Microrough Silicon,” Optics Letters, 1284, vol. 22, no. 17, September 1, 1997.
Scheer, Bradley W. and Stover, John C., “Development of a Smooth-Surface Microroughness Standard,” SPIE ’97 Symposium, Scattering and Surface Roughness, Proceedings 3141, pgs 78-87, San Diego, July 28 – August 1, 1997.
Mulholland, George W., Scheer, Bradley W., and Goodall, R.K, “Challenges with Characterization and Detection of Reference Particles on Various Substrates,” Society of Photo-optical and Instrumental Engineers, SPIE ’96 Symposium: Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays, Denver, Co., vol. 2862, pgs 104-118, August 5-9, 1996.
Hirleman, E.D., Bawolek, E.J., and Scheer, Bradley W, “Light Scattering by Cylindrical Etch Pit Artifacts: Kirchoff Diffraction Theory and Experiments,” International Workshop on Semiconductor Characterization: Present Status and Future Needs, NIST, Gaithersburg, MD, January 30 – February 2, 1995
Registered Patent Agent/Attorney, Schneck & Schneck, 2003 – 2008
Registered Patent Agent, Carr & Ferrell, LLP, 2000 – 2003
Director of R&D, KLA-Tencor, 1989 – 2000
Senior R&D Engineer, Atcor, Inc., Instrumentation Division, 1988-1989